- Conference date: 21–26 October 2007
- Location: Campinas, São Paulo (Brazil)
The Ronchi's optic test represents today an efficient, quick and high accurate way (in the electromagnetic wavelength order in use) to know the general optics characteristics of a given reflecting surface. Among these characteristics, we found mainly the curvature radii and in consequence the focal distance of the surface, including also the aberrations produced on the wavefront; these aberrations can be observed immediately thanks to the capacity of this test to show them directly.
In spite of the information that can be obtained from a surface using the Ronchi's test and the practicably of the same, this one has an enormous potential for being used as a calibrator to adjust the correct position and inclination of piecewise mirrors over the shape of a revolution surface. Using this, we want to propose a method to level a complex surface, trying to minimize, up to the appropriate order, the differences between the segments of mirror embedded in the surface.
To carry on this proposal, we design and make an spherical concave lens, separated into four pieces and fixed together in one single surface. This surface can be used to measure the effects of different angle and position effects over a ronchigram.
To corroborate the efficacy of this test, we use a Michelson/s interferometer with white light, as a high sensitive tool for measuring mirror separation, due to the short coherence length of the source. In this natural manner, we find a way to align the piecewise mirrors over the surface, and we can estimate the magnitude order of the differences between mirrors. Finally, we compare both results.
- Electromagnetic optics
- Optical aberrations
- Segmented optics
- Surface optics
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Y. K. Semertzidis, M. Aoki, M. Auzinsh, V. Balakin, A. Bazhan, G. W. Bennett, R. M. Carey, P. Cushman, P. T. Debevec, A. Dudnikov, F. J. M. Farley, D. W. Hertzog, M. Iwasaki, K. Jungmann, D. Kawall, B. Khazin, I. B. Khriplovich, B. Kirk, Y. Kuno, D. M. Lazarus, L. B. Leipuner, V. Logashenko, K. R. Lynch, W. J. Marciano, R. McNabb, W. Meng, J. P. Miller, W. M. Morse, C. J. G. Onderwater, Y. F. Orlov, C. S. Ozben, R. Prigl, S. Rescia, B. L. Roberts, N. Shafer‐Ray, A. Silenko, E. J. Stephenson, K. Yoshimura and EDM Collaboration
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