- Conference date: 19-23 April 1993
- Location: London, United Kingdom
X‐ray spectroscopy with high spectral (up to ) and spatial resolution (up to microns) is discussed. Devices based on crystals, difraction and Bragg‐Fresnel elements and there application in Z‐ and X‐pinches experiments are observed.
MOST READ THIS MONTH
MOST CITED THIS MONTH
Article metrics loading...