- Conference date: 22–25 July 2008
- Location: Chicago (Illinois)
Silicon Carbide (SiC) mirrors have significant advantages compared to glass mirrors. They are less dense, possess very high elastic stiffness and have a low thermal expansion coefficient over a wide temperature range, and hence suitable for aerospace applications. However, the manufacturing process induces significant residual stress and thickness variation. The polishing process used to produce high quality mirrors, alters both the residual stress and thickness of the mirror. In some cases this might produce local damage and limit the usability of the mirror. At present there is a need for NDE techniques to evaluate the damage and ensure the quality of SiC mirrors. To address this issue, we have developed ultrasonic methods to measure simultaneously the local variation in thickness and the through‐thickness longitudinal wave velocity in SiC mirrors. The impact of the variations in the material properties are discussed with reference to the changes in residual stress distribution after polishing.
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