Skip to main content

News about Scitation

In December 2016 Scitation will launch with a new design, enhanced navigation and a much improved user experience.

To ensure a smooth transition, from today, we are temporarily stopping new account registration and single article purchases. If you already have an account you can continue to use the site as normal.

For help or more information please visit our FAQs.

banner image
Mechanical Failure of Thin Ta and Cu/Ta Layers on Polyimide Substrates: A Synchrotron‐Based Technique for In Situ Characterization
USD
/content/aip/proceeding/aipcp/10.1063/1.3169250
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.3169250
/content/aip/proceeding/aipcp/10.1063/1.3169250
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/proceeding/aipcp/10.1063/1.3169250
2009-06-18
2016-12-09

Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=proceedings.aip.org/1143/10.1063/1.3169250&pageURL=http://scitation.aip.org/content/aip/proceeding/aipcp/10.1063/1.3169250'
Right1,Right2,Right3,