- Conference date: 22–26 March 2009
- Location: Monterey (California)
After a brief review of the processes taking place in electron beam ions traps (EBITs), the means by which EBITs are used to make measurements of electron impact ionization cross‐sections and dielectronic recombination resonance strengths are discussed. In particular, results from a study involving holmium ions extracted from an electron beam ion trap are used to illustrate a technique for studying dielectronic recombination in open‐shell target ions.
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