X‐ray And EUV Spectroscopy Of Highly Charged Tungsten Ions
- Conference date: 22–26 March 2009
- Location: Monterey (California)
The Berlin EBIT has been established by the Max‐Planck‐Institut für Plasmaphysik to generate atomic physics data in support of research in the field of controlled nuclear fusion, by measuring the radiation from highly charged ions in the x‐ray, extreme ultraviolet and visible spectral ranges and providing valuable diagnostics for high temperature plasmas . In future fusion devices, for example ITER, currently being constructed at Cadarache, France, the plasma facing components will be armored with high‐Z materials, most likely tungsten, due to the favorable properties of this element . At the same time the tremendous radiation cooling of these high‐Z materials represents a threat to fusion and obliges one to monitor carefully the radiation. With EBIT a selected ensemble of ions in specific charge states can be produced, stored and excited for spectroscopic investigations. Employing this technique, we have for example resolved the wide structure observed around 5 nm at the ASDEX Upgrade tokamak as originating from E1‐transitions into the open 4d shell of tungsten ions in charge states to producing a band‐like emission pattern . Further, these ions emit well‐separated M1 lines in the EUV range around 65 nm suitable for plasma diagnostics . Kr‐like to Cr‐like tungsten ions ( to ) show strong soft‐x‐ray lines in the range 0.5 to 2 and 5 to 15 nm. Lines of even higher charged tungsten ions, up to Ne‐like abundant in the core plasma of present and future fusion test devices, have been investigated with high resolution Bragg‐crystal spectroscopy at 0.13 nm . Recently, x‐ray spectroscopic measurements of the dielectronic recombination LMn resonances of to ions have been preformed and compare well with atomic structure calculations.
- Extreme ultraviolet radiation
- Charged particle spectroscopy
- Fusion reactors
- Plasma diagnostics
- Materials properties
- Atomic and molecular physics
- Ultraviolet spectroscopy
- Visible spectroscopy
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Y. K. Semertzidis, M. Aoki, M. Auzinsh, V. Balakin, A. Bazhan, G. W. Bennett, R. M. Carey, P. Cushman, P. T. Debevec, A. Dudnikov, F. J. M. Farley, D. W. Hertzog, M. Iwasaki, K. Jungmann, D. Kawall, B. Khazin, I. B. Khriplovich, B. Kirk, Y. Kuno, D. M. Lazarus, L. B. Leipuner, V. Logashenko, K. R. Lynch, W. J. Marciano, R. McNabb, W. Meng, J. P. Miller, W. M. Morse, C. J. G. Onderwater, Y. F. Orlov, C. S. Ozben, R. Prigl, S. Rescia, B. L. Roberts, N. Shafer‐Ray, A. Silenko, E. J. Stephenson, K. Yoshimura and EDM Collaboration
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