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Characterization of Nano‐Scale Graphene Devices for Thickness and Defect Metrology Using Micro and Nano‐Raman Spectroscopy
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/content/aip/proceeding/aipcp/10.1063/1.3251209
2009-09-28
2015-05-30
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Scitation: Characterization of Nano‐Scale Graphene Devices for Thickness and Defect Metrology Using Micro and Nano‐Raman Spectroscopy
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.3251209
10.1063/1.3251209
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