- Conference date: 28 June–3 July 2009
- Location: Nashville (Tennessee)
We report anultrafast x‐ray phase‐contrast imaging study of a gasless composite reactive (Si‐coated W wire) system undergoing high heating rates Construction of an imaging system utilizing a high‐speed CMOS camera and the third‐generation synchrotron at the Advanced Photon Source of Argonne National Laboratory allows for imaging of microstructural changes of the reactive system over previously unstudied time frames and length scales. Imaging was performed at speeds up to 36,000 frames per second with 10 μm spatial resolution. Using Computer‐Assisted Electrothermography (CAE), the heating rate of the gasless reactive system W‐Si is controlled and its kinetics is measured. A physical description of the changes undergone by the system during melting and reaction are captured by the high‐speed imaging system and correlated to the recorded CAE data. The initial Si melt, as well as the initial reaction, is seen to be non‐uniform along the wire. A secondary reaction, undetected by CAE data, is observed and tracked through the imaging.
- Control systems
- Materials modification
- Metal insulator semiconductor structures
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