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Interface effects in ZnO metal‐insulator‐semiconductor and metal‐semiconductor structures
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/content/aip/proceeding/aipcp/10.1063/1.3295509
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.3295509
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/content/aip/proceeding/aipcp/10.1063/1.3295509
2010-01-04
2016-07-31

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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
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