- Conference date: 15–18 September 2009
- Location: Karlsruhe (Germany)
We present tomographic slices of fast X‐ray computed microtomography, focusing on one hand on the comparison of scans with identical scan time but varying experimental settings, on the other hand on comparing scans with total scan times that are two orders of magnitude apart. We show that streaks in the Fourier‐space of the transformed images appear when the number of projections is reduced. These streaks exhibit spacing by the same angle as the one that is covered by the sample during the exposure time of one projection. Further a method for the estimation of information loss in fast scans is presented.
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