- Conference date: 15–18 September 2009
- Location: Karlsruhe (Germany)
The ICXOM series of meetings began in 1956 and for over 50 years have been conferences devoted to the topic of “X‐ray microanalysis,” both for those interested in developing instrumentation and methods of analysis and for scientists mainly interested in using X‐ray micro‐analysers for investigations of an applied nature. This contribution surveys the ICXOM series origins, its development and trends over the years.
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