PHASE SENSITIVE X‐RAY IMAGING: TOWARDS ITS INTERDISCIPLINARY APPLICATIONS
- Conference date: 16–21 May 2010
- Location: Monte Verita (Ascona)
X‐ray phase imaging including phase tomography has been attracting increasing attention during the past few decades. The advantage of X‐ray phase imaging is that an extremely high sensitivity is achieved for weakly absorbing materials, such as biological soft tissues, which generate a poor contrast by conventional schemes. Especially for such living samples, where the reduction of the applied dose is of paramount interest, phase sensitive measurements schemes have an inherent potential for a significant dose reduction combined with an image quality enhancement. Several methods have been invented for x‐ray phase contrast imaging that either use an approach based on interferometry, diffraction or wave‐field propagation. Some of these techniques have a potential for commercial applications, such as in medicine, non‐destructive testing, security and inspection. The scope of this manuscript thus deals with one particular such technique that measures the diffraction caused by the specimen by means of a grating interferometer. Examples of measurements are shown that depict the potential of phase contrast imaging for future commercial applications, such as in medical imaging, non‐destructive testing and inspection for quality control. The current state of the technology is briefly reviewed as well as its shortcomings to be overcome with regard to the applications.
- Medical imaging
- Medical image contrast
- Medical image quality
- Testing procedures
- Diffraction gratings
- Image enhancement
- Interferometric imaging
MOST READ THIS MONTH
MOST CITED THIS MONTH
Y. K. Semertzidis, M. Aoki, M. Auzinsh, V. Balakin, A. Bazhan, G. W. Bennett, R. M. Carey, P. Cushman, P. T. Debevec, A. Dudnikov, F. J. M. Farley, D. W. Hertzog, M. Iwasaki, K. Jungmann, D. Kawall, B. Khazin, I. B. Khriplovich, B. Kirk, Y. Kuno, D. M. Lazarus, L. B. Leipuner, V. Logashenko, K. R. Lynch, W. J. Marciano, R. McNabb, W. Meng, J. P. Miller, W. M. Morse, C. J. G. Onderwater, Y. F. Orlov, C. S. Ozben, R. Prigl, S. Rescia, B. L. Roberts, N. Shafer‐Ray, A. Silenko, E. J. Stephenson, K. Yoshimura and EDM Collaboration
Article metrics loading...