- Conference date: 27 September–2 October 2009
- Location: Melbourne (Australia)
VESPERS beamline is a hard X‐ray microprobe beamline at the Canadian Light Source (CLS). It is designed to measure material structure and composition using X‐ray diffraction (XRD) and X‐ray fluorescence (XRF) spectroscopy. Four widely differing bandwidths, ∼0.01%, ∼1.6%, ∼10%, and fully polychromatic beam, are selectable to simplify the Laue diffraction analysis and to optimize XRF excitation. Also, X‐ray absorption spectroscopy (XAS) can be employed using ∼0.01% bandwidth to provide chemical analytical information. Currently, the beamline is in its late commissioning phase. A number of test experiments have been performed to show the Laue XRD, XRF and XAS capabilities of the beamline. Beamline control and data acquisition software have been developed to include the essential functions for user operation. Full user operation starts in 2010.
- X-ray diffraction
- X-ray fluorescence spectroscopy
- Light diffraction
- X-ray absorption spectroscopy
- Absorption spectroscopy
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Y. K. Semertzidis, M. Aoki, M. Auzinsh, V. Balakin, A. Bazhan, G. W. Bennett, R. M. Carey, P. Cushman, P. T. Debevec, A. Dudnikov, F. J. M. Farley, D. W. Hertzog, M. Iwasaki, K. Jungmann, D. Kawall, B. Khazin, I. B. Khriplovich, B. Kirk, Y. Kuno, D. M. Lazarus, L. B. Leipuner, V. Logashenko, K. R. Lynch, W. J. Marciano, R. McNabb, W. Meng, J. P. Miller, W. M. Morse, C. J. G. Onderwater, Y. F. Orlov, C. S. Ozben, R. Prigl, S. Rescia, B. L. Roberts, N. Shafer‐Ray, A. Silenko, E. J. Stephenson, K. Yoshimura and EDM Collaboration
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