thin film was deposited on polypropylene carbonate (PPC) plastic substrate by direct current (DC) sputtering. The measurements of the absorption
spectrum and the photoluminescence of the film were carried out. ZnO Metal‐Semiconductor‐Metal (MSM) photodetector with palladium (Pd) contact electrodes was then fabricated. The structural and electrical properties of the detector were investigated using the current‐voltage (I–V) measurements.