Tomographic Hard X‐ray Phase Contrast Micro‐ and Nano‐imaging at TOMCAT
- Conference date: 15–18 February 2010
- Location: Melbourne (Australia)
This article illustrates the phase contrast instrumentation installed at the Tomographic Microscopy and Coherent Radiology beamline (TOMCAT) of the Swiss Light Source. Our experimental framework has been designed to extract phase information at spatial resolutions covering three orders of magnitude. For moderate (5–10 microns) resolutions we implemented a two‐gratings interferometer, operated at energies between 14 and 40 keV. For high resolution (1–5 microns) we obtain phase information thanks to a modified transport of intensity approach. For very high‐resolutions (0.1–0.5 microns) we developed a broadband hard X‐ray full‐field microscope operated in Zernike‐phase contrast.
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