- Conference date: 18–22 April 2010
- Location: Santa Fe, (New Mexico)
This contribution investigates laser‐induced damage of thin film and bulk polymer samples, with the focus on physical processes occurring close to the damage threshold. In‐situ real‐time reflectivity (RTR) measurements with picosecond (ps) and nanosecond (ns) temporal resolution were performed on thin polymer films on a timescale up to a few microseconds (μs). A model for polymer thin film damage is presented, indicating that irreversible chemical modification processes take place already below the fluence threshold for macroscopic damage. On dye‐doped bulk polymer filters (as used for laser goggles), transmission studies using fs‐and ps‐laser pulses reveal the optical saturation behavior of the material and its relation to the threshold of permanent damage. Implications of the sub‐threshold processes for laser safety applications will be discussed for thin film and bulk polymer damage.
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