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Impact of Morphological Features on the Dielectric Breakdown at Interfaces
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10.1063/1.3518308
/content/aip/proceeding/aipcp/10.1063/1.3518308
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.3518308
/content/aip/proceeding/aipcp/10.1063/1.3518308
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/content/aip/proceeding/aipcp/10.1063/1.3518308
2010-11-01
2015-08-05
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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
Scitation: Impact of Morphological Features on the Dielectric Breakdown at SiO2/3C‐SiC Interfaces
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.3518308
10.1063/1.3518308
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