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Structural Properties Studies of Zinc Oxide Thin Film Grown on Silicon Carbide by Means of X‐ray Diffraction Technique
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/content/aip/proceeding/aipcp/10.1063/1.3573748
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/content/aip/proceeding/aipcp/10.1063/1.3573748
2011-03-30
2016-05-29

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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
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