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Structural Properties Studies of Zinc Oxide Thin Film Grown on Silicon Carbide by Means of X‐ray Diffraction Technique
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10.1063/1.3573748
/content/aip/proceeding/aipcp/10.1063/1.3573748
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.3573748
/content/aip/proceeding/aipcp/10.1063/1.3573748
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/content/aip/proceeding/aipcp/10.1063/1.3573748
2011-03-30
2015-03-01
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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
Scitation: Structural Properties Studies of Zinc Oxide Thin Film Grown on Silicon Carbide by Means of X‐ray Diffraction Technique
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.3573748
10.1063/1.3573748
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