- Conference date: 1–3 December 2010
- Location: Kuala Lumpur, (Malaysia)
In this paper, single cell adhesion force was measured using a nanofork. The nanofork was used to pick‐up a single cell on a line‐patterned substrate inside ESEM. The line‐patterned substrate was used to provide small gaps between the single cells and the substrate. Therefore, the nanofork could be inserted through these gaps in order to successfully pick‐up a single cell. Adhesion force was measured during the cell pick‐up process from the deflection of the cantilever beam. The nanofork was fabricated using focused ion beam (FIB) etching process while the line‐patterned substrate was fabricated using nanoimprinting technology. As to investigate the effect of contact area on the strength of the adhesion force, two sizes of gap distance of line‐patterned substrate were used, i.e. 1 μm and 2 μm. Results showed that cells attached on the 1 μm gap line‐patterned substrate required more force to be released as compared to the cells attached on the 2 μm gap line‐patterned substrate.
- Cell adhesion
- Focused ion beam technology
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