- Conference date: 26–28 October 2011
- Location: Bad Honnef, (Germany)
Multi‐photon photoemission electron microscopy (PEEM) is an excellent tool for mapping the local near‐field distribution around nanostructures. The combination of PEEM with a pump‐probe laser setup enables the investigation of the dynamics of plasmonic excitations. The phase‐sensitive superposition of different plasmonic modes leads to a spatially controllable enhancement of the near‐field inside and in the vicinity of a metallic nanostructure. By controlling the relative phase Θ between two orthogonally polarized light pulses the spatial distribution of the near‐field is manipulated on the basis of the interference of the near‐field modes.
- Photoemission electron microscopy
- Optical imaging
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