Structural and Dielectric Properties of Ceramic
- Conference date: 2–4 December 2010
- Location: Bilaspur, Chhattisgarh, (India)
The polycrystalline sample of (LSN) was prepared by a high temperature solid‐state reaction technique. Studies of structural and microstructural characterizations were performed by X‐ray diffraction (XRD) and scanning electron microscope (SEM) techniques. X‐ray studies reveal that the material has an orthorhombic structure at room temperature. Dielectric properties were measured over a wide range of temperature and frequency Conductivity of the material increases with rise in temperature.
- Dielectric properties
- Scanning electron microscopy
- X-ray diffraction
- Electric measurements
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