- Conference date: 29 Dec 1992 − 5 Jan 1993
- Location: Hyderabad, Andhra Pradesh (India)
High precision electrical resistivity (ρ) measurements are carried out on amorphous Fe80−x Ni x B20 (x=20, 40, 50, and 60) alloys in the temperature range 5 to 750 K. All the samples show a minimum in resistivity (ρmin) and the temperature (T min), at which ρmin occurs, lies in the temperature range 10–15 K. For T < T min, ρ shows logarithmic temperature dependence and above T min , ρ varies quadratically with temperature. Measurement of Curie (T c ) and crystallization (T x ) temperatures precedes Curie temperature and for other samples T c value decreases with increasing Ni concentration. A detailed data analysis, carried out in the light of existing theories with emphasis to magnetic contribution to total resistivity in these alloys, is presented and compared with the earlier results.
- Electrical resistivity
- Curie point
- Amorphous magnetic materials
Y. K. Semertzidis, M. Aoki, M. Auzinsh, V. Balakin, A. Bazhan, G. W. Bennett, R. M. Carey, P. Cushman, P. T. Debevec, A. Dudnikov, F. J. M. Farley, D. W. Hertzog, M. Iwasaki, K. Jungmann, D. Kawall, B. Khazin, I. B. Khriplovich, B. Kirk, Y. Kuno, D. M. Lazarus, L. B. Leipuner, V. Logashenko, K. R. Lynch, W. J. Marciano, R. McNabb, W. Meng, J. P. Miller, W. M. Morse, C. J. G. Onderwater, Y. F. Orlov, C. S. Ozben, R. Prigl, S. Rescia, B. L. Roberts, N. Shafer‐Ray, A. Silenko, E. J. Stephenson, K. Yoshimura and EDM Collaboration
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