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Stress evolution during stress migration and electromigration in passivated interconnect lines
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10.1063/1.45694
/content/aip/proceeding/aipcp/10.1063/1.45694
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.45694
/content/aip/proceeding/aipcp/10.1063/1.45694
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/content/aip/proceeding/aipcp/10.1063/1.45694
1994-06-25
2014-12-20
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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
Scitation: Stress evolution during stress migration and electromigration in passivated interconnect lines
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.45694
10.1063/1.45694
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