- Conference date: 3–7 December 2012
- Location: Indian Institute of Technology, Bombay, Mumbai, India
This paper describes the work on the development of Dielectric Constant Microscopy for biological materials using double pass amplitude modulation method. The dielectric constant information can be obtained at nanometer scales using this technique. Electrostatic force microscopy images of biological materials are presented. The images obtained from the EFM technique mode clearly show inversion contrast and gives the spatial variation of tip-sample capacitance. The EFM images are further processed to obtain dielectric constant information at nanometer scales.
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