- Conference date: 19–21 November 2012
- Location: Colmar Tropicale, Bukit Tinggi, Pahang, Malaysia
This work signifies the influence of ambient temperature and measurement conditions on thermal transient measurement of high power infrared (IR) emitter. In order to study the influence of ambient temperature on thermal transient measurement, the IR emitter is driven by constant current with varying ambient temperature. Likewise, measurements by using cold-plate and oven have been performed to examine the influence of measurement conditions. It has been observed that with increasing of ambient temperature, junction-to-board thermal resistance RthJB increases from 4.76 K/W to 6.88 K/W. It is also found that measurement carried out on a cold-plate offers much lower junction-toambient thermal resistance RthJB (5.24 K/W) compared to that performed in an oven (35.5 K/W).
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