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Polarized infrared reflectance characterization of wurtzite ZnO/GaN heterostructure on 6H-SiC substrate
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10.1063/1.4803575
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/content/aip/proceeding/aipcp/10.1063/1.4803575
2013-05-08
2014-07-13
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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
Scitation: Polarized infrared reflectance characterization of wurtzite ZnO/GaN heterostructure on 6H-SiC substrate
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.4803575
10.1063/1.4803575
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