- Conference date: 19−23 Sep 1994
- Location: Cancun (Mexico)
Structural phase transition of Si(hhm) surface with m/h=1.4 to 1.5 was studied by reflection electron microscopy (REM). Finely spaced diffraction spots in reflection high energy electron diffraction (RHEED) pattern disappear as the surface is heated above 900 °C and reflections from the bulk structure remain. In REM images, steps in the crystallographic directions changes into curved one. At temperatures around 920 °C lattice fringes corresponding to the finely spaced RHEED spots disappear, which is followed by disappearance of step images. These observations suggest a roughening transition of the surface.
- Surface phase transitions
- Reflection high energy electron diffraction
- Surface structure
- Surface patterning
- Crystal structure
Daniel Baumann, Mark G. Jackson, Peter Adshead, Alexandre Amblard, Amjad Ashoorioon, Nicola Bartolo, Rachel Bean, Maria Beltrán, Francesco de Bernardis, Simeon Bird, Xingang Chen, Daniel J. H. Chung, Loris Colombo, Asantha Cooray, Paolo Creminelli, Scott Dodelson, Joanna Dunkley, Cora Dvorkin, Richard Easther, Fabio Finelli, Raphael Flauger, Mark P. Hertzberg, Katherine Jones‐Smith, Shamit Kachru, Kenji Kadota, Justin Khoury, William H. Kinney, Eiichiro Komatsu, Lawrence M. Krauss, Julien Lesgourgues, Andrew Liddle, Michele Liguori, Eugene Lim, Andrei Linde, Sabino Matarrese, Harsh Mathur, Liam McAllister, Alessandro Melchiorri, Alberto Nicolis, Luca Pagano, Hiranya V. Peiris, Marco Peloso, Levon Pogosian, Elena Pierpaoli, Antonio Riotto, Uroš Seljak, Leonardo Senatore, Sarah Shandera, Eva Silverstein, Tristan Smith, Pascal Vaudrevange, Licia Verde, Ben Wandelt, David Wands, Scott Watson, Mark Wyman, Amit Yadav, Wessel Valkenburg and Matias Zaldarriaga
Data & Media loading...
Article metrics loading...