- Conference date: 19−23 Sep 1994
- Location: Cancun (Mexico)
Structural phase transition of Si(hhm) surface with m/h=1.4 to 1.5 was studied by reflection electron microscopy (REM). Finely spaced diffraction spots in reflection high energy electron diffraction (RHEED) pattern disappear as the surface is heated above 900 °C and reflections from the bulk structure remain. In REM images, steps in the crystallographic directions changes into curved one. At temperatures around 920 °C lattice fringes corresponding to the finely spaced RHEED spots disappear, which is followed by disappearance of step images. These observations suggest a roughening transition of the surface.
- Surface phase transitions
- Reflection high energy electron diffraction
- Surface structure
- Surface patterning
- Crystal structure
Y. K. Semertzidis, M. Aoki, M. Auzinsh, V. Balakin, A. Bazhan, G. W. Bennett, R. M. Carey, P. Cushman, P. T. Debevec, A. Dudnikov, F. J. M. Farley, D. W. Hertzog, M. Iwasaki, K. Jungmann, D. Kawall, B. Khazin, I. B. Khriplovich, B. Kirk, Y. Kuno, D. M. Lazarus, L. B. Leipuner, V. Logashenko, K. R. Lynch, W. J. Marciano, R. McNabb, W. Meng, J. P. Miller, W. M. Morse, C. J. G. Onderwater, Y. F. Orlov, C. S. Ozben, R. Prigl, S. Rescia, B. L. Roberts, N. Shafer‐Ray, A. Silenko, E. J. Stephenson, K. Yoshimura and EDM Collaboration
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