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High-resolution, high-accuracy, mid-IR refractive index measurements in silicon
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/content/aip/proceeding/aipcp/10.1063/1.56897
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/content/aip/proceeding/aipcp/10.1063/1.56897
1998-11-24
2014-11-24
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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
Scitation: High-resolution, high-accuracy, mid-IR (450 cm−1⩽ω⩽4000 cm−1) refractive index measurements in silicon
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.56897
10.1063/1.56897
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