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FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009

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1dd066124a513eff08aad5ba332a2e41 conferences.conference_proceedingszxybnytfddd
Scitation: FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/1173
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