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Ultrasonic measurement of condensate film thickness
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The current work describes a modified time-of-flight ultrasound signal processing technique applied to the study of a distal liquid layer with a free surface. The technique simulates multiple reflections analytically and determines the film thickness by comparison to the measured pulse echo signal. The technique is applied with transducers to an -pentane film condensing on a copper plate. The technique proved capable of measuring liquid thickness from approximately , the acoustic wavelength in pentane, to greater than . Near the lower thickness limit, echoes from the liquid/vapor interface overlap each other and the significantly larger echoes from the metal/liquid interface.
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