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Low-frequency pulse echo reflection of the fundamental shear horizontal mode from part-thickness elliptical defects in plates
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10.1121/1.3409446
/content/asa/journal/jasa/127/6/10.1121/1.3409446
http://aip.metastore.ingenta.com/content/asa/journal/jasa/127/6/10.1121/1.3409446

Figures

Image of FIG. 1.
FIG. 1.

Schematic of the defect models: (a) flat-bottomed elliptical hole and (b) circular hole with tapered depth profile; (c) schematic of FE modeling configuration.

Image of FIG. 2.
FIG. 2.

Contour snapshots of the magnitude of resultant displacement from FE simulations, at different time instances: (a) incident SH0 wave field; (b) scattered SH0 mode by an elliptical defect (: 16 mm, AR: 2) together with mode converted S0 mode.

Image of FIG. 3.
FIG. 3.

Reflection ratio spectrum of the SH0 mode obtained from 50% flat-bottomed elliptical defects with different lengths and aspect ratios (0° incidence). Reflected signals are monitored at 250 mm away from the center of defects.

Image of FIG. 4.
FIG. 4.

(a) FE predictions of the amplitude of the reflected SH0 wave from 50% flat-bottomed elliptical defects with different shapes and sizes, monitored at different distances from the defects. The monitoring distance is normalized to the individual defect width; (b) reflection ratio spectrum of the SH0 mode from 50% flat-bottomed elliptical defects with different shape and size. Reflected signals are monitored at a position eight times the individual defect width from the defect center.

Image of FIG. 5.
FIG. 5.

Pulse echo reflection matrix obtained from 50% flat-bottomed defects with different sizes and aspect ratios: (a) defect A, (b) defect B, (c) defect C, and (d) defect D (defect shapes are plotted in white dashed curves and their parameters are listed in Table I). The black dashed curves represent the position of the first peak on the reflection ratio spectrum.

Image of FIG. 6.
FIG. 6.

(a) The frequency of the first peak on the reflection ratio spectrum at difference incidence angle, extracted from the pulse echo reflection matrix of four defects in Fig. 5; (b) the corresponding maximum reflection ratio at the peak position; (c) the effective defect length at each incidence angle normalized to the wavelength at the corresponding peak position frequency (points: data extracted from Fig. 5; line: third-order polynomial interpolation).

Image of FIG. 7.
FIG. 7.

(a) The first peak on the reflection ratio spectrum obtained at different incidence angles for defect shape C in Table I with different maximum depth; (b) the corresponding maximum reflection ratio at the peak position; (c) the peak position frequencies at different angles normalized to their maximum value at 90° and (d) the maximum reflection ratios at different angles normalized to their maximum value at 90° (points: data extracted from the pulse echo reflection matrix; line: third-order polynomial interpolation).

Image of FIG. 8.
FIG. 8.

Reflection ratio spectrum obtained from circular holes with flat-bottomed and tapered profiles (parameters listed in Table II).

Image of FIG. 9.
FIG. 9.

Schematic of general setup for experimental measurements.

Image of FIG. 10.
FIG. 10.

Comparison of FE simulation (lines) and experimental measurements (points) of reflection ratio spectrum obtained from (a) a 75% flat-bottomed elliptical hole (AR: 2, : 16 mm, : 32 mm, at 0°) and (b) a 50% flat-bottomed elliptical hole (AR: 3, : 10.6 mm, : 32 mm, at 0°).

Image of FIG. 11.
FIG. 11.

Comparison of FE simulation (lines) and experimental measurements (points) of reflection ratio spectrum obtained from circular holes with flat-bottomed and tapered profiles.

Tables

Generic image for table
TABLE I.

Shape parameters of the flat-bottom elliptical defects considered in the FE modeling (defined at 0° in Fig. 1).

Generic image for table
TABLE II.

Geometry of the tapered profile for circular holes.

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/content/asa/journal/jasa/127/6/10.1121/1.3409446
2010-06-09
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low-frequency pulse echo reflection of the fundamental shear horizontal mode from part-thickness elliptical defects in plates
http://aip.metastore.ingenta.com/content/asa/journal/jasa/127/6/10.1121/1.3409446
10.1121/1.3409446
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