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Influence of electrostatic forces on the investigation of dopant atoms in layered semiconductors by scanning tunneling microscopy/spectroscopy and atomic force microscopy
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10.1116/1.580563
/content/avs/journal/jvsta/15/3/10.1116/1.580563
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/15/3/10.1116/1.580563
/content/avs/journal/jvsta/15/3/10.1116/1.580563
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/content/avs/journal/jvsta/15/3/10.1116/1.580563
1997-05-01
2015-03-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Influence of electrostatic forces on the investigation of dopant atoms in layered semiconductors by scanning tunneling microscopy/spectroscopy and atomic force microscopy
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/15/3/10.1116/1.580563
10.1116/1.580563
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