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Structure of ultrathin interfaces studied by photoelectron spectroscopy
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10.1116/1.581805
/content/avs/journal/jvsta/17/4/10.1116/1.581805
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/17/4/10.1116/1.581805
/content/avs/journal/jvsta/17/4/10.1116/1.581805
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/content/avs/journal/jvsta/17/4/10.1116/1.581805
1999-07-01
2015-08-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structure of ultrathin SiO2/Si(111) interfaces studied by photoelectron spectroscopy
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/17/4/10.1116/1.581805
10.1116/1.581805
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