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Parametrization of optical properties of indium–tin–oxide thin films by spectroscopic ellipsometry: Substrate interfacial reactivity
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10.1116/1.1421596
/content/avs/journal/jvsta/20/1/10.1116/1.1421596
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/20/1/10.1116/1.1421596
/content/avs/journal/jvsta/20/1/10.1116/1.1421596
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/content/avs/journal/jvsta/20/1/10.1116/1.1421596
2002-01-01
2015-05-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Parametrization of optical properties of indium–tin–oxide thin films by spectroscopic ellipsometry: Substrate interfacial reactivity
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/20/1/10.1116/1.1421596
10.1116/1.1421596
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