Variations in the refractive index of composite films deposited by (a) e-beam evaporation (square) and (b) IBAD (circle), with atomic concentration. The refractive index was measured at .
Specular transmittance and reflectance spectra of composite films deposited by IBAD, with varying atomic concentration (100%, 75%, 50%, 35%, 20%, 5%, 0%).
XRD spectra of composite films deposited by IBAD, with varying atomic concentration.
SEM images of thin films deposited on a silicon wafer by IBAD; (a) film, (b) , and (c) . All images have the same magnifications.
Surface morphology of composite films with (a) 0% and (b) concentration, taken by AFM.
FTIR specular reflectance spectra ranging from 3000 to related to the water absorption for , , , and films.
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