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Relationship between optical properties and microstructure of composite thin films
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10.1116/1.1782638
/content/avs/journal/jvsta/22/5/10.1116/1.1782638
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/22/5/10.1116/1.1782638
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Variations in the refractive index of composite films deposited by (a) e-beam evaporation (square) and (b) IBAD (circle), with atomic concentration. The refractive index was measured at .

Image of FIG. 2.
FIG. 2.

Specular transmittance and reflectance spectra of composite films deposited by IBAD, with varying atomic concentration (100%, 75%, 50%, 35%, 20%, 5%, 0%).

Image of FIG. 3.
FIG. 3.

XRD spectra of composite films deposited by IBAD, with varying atomic concentration.

Image of FIG. 4.
FIG. 4.

SEM images of thin films deposited on a silicon wafer by IBAD; (a) film, (b) , and (c) . All images have the same magnifications.

Image of FIG. 5.
FIG. 5.

Surface morphology of composite films with (a) 0% and (b) concentration, taken by AFM.

Image of FIG. 6.
FIG. 6.

FTIR specular reflectance spectra ranging from 3000 to related to the water absorption for , , , and films.

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/content/avs/journal/jvsta/22/5/10.1116/1.1782638
2004-09-23
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Relationship between optical properties and microstructure of CeO2–SiO2 composite thin films
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/22/5/10.1116/1.1782638
10.1116/1.1782638
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