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Analysis on thermal properties of tin doped indium oxide films by picosecond thermoreflectance measurement
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10.1116/1.1872014
/content/avs/journal/jvsta/23/4/10.1116/1.1872014
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/23/4/10.1116/1.1872014
/content/avs/journal/jvsta/23/4/10.1116/1.1872014
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/content/avs/journal/jvsta/23/4/10.1116/1.1872014
2005-06-28
2014-09-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis on thermal properties of tin doped indium oxide films by picosecond thermoreflectance measurement
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/23/4/10.1116/1.1872014
10.1116/1.1872014
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