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Structural and optical properties of erbium-doped thin films
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10.1116/1.1938979
/content/avs/journal/jvsta/23/4/10.1116/1.1938979
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/23/4/10.1116/1.1938979
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns of BST:Er thin films annealed at various temperatures (a) and doped with various Er concentrations at sintering temperature (b). Secondary phases are marked by various symbols.

Image of FIG. 2.
FIG. 2.

Raman spectra of BST thin films annealed at temperature (a) and typical expanded XRD data around 45.5° (b). An extra peak comes from the laser source and is denoted by . The dotted and solid lines represent the experimental and fitting results, respectively.

Image of FIG. 3.
FIG. 3.

Refractive index of BST:Er thin films annealed at with various concentrations.

Image of FIG. 4.
FIG. 4.

Room temperature photoluminescence spectra of BST thin films doped with Er under various annealing temperatures. Appropriate offset has been made to highlight the variations in the line shapes of PL spectra.

Image of FIG. 5.
FIG. 5.

(a) Excitation-dependent photoluminescence spectra of BST:Er thin film. The arrow indicates the direction of adding excitation power. (b) Integrated intensities of green emission vs the excitation power.

Image of FIG. 6.
FIG. 6.

Integrated green emission intensities of BST:Er thin films as a function of Er concentration and annealing temperatures.

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/content/avs/journal/jvsta/23/4/10.1116/1.1938979
2005-06-23
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structural and optical properties of erbium-doped Ba0.7Sr0.3TiO3 thin films
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/23/4/10.1116/1.1938979
10.1116/1.1938979
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