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Study of optical recording bits by scanning surface potential microscopy
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10.1116/1.1943449
/content/avs/journal/jvsta/23/4/10.1116/1.1943449
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/23/4/10.1116/1.1943449
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) and (b) Energy diagrams for electrons in two metals (M1 and M2). (a) Metals are isolated. (b) Metals are connected electrically and charged. : vacuum energy level; : Fermi energy; : work function of metal ; : work function difference between M1 and M2. (c) and (d) Schematic diagrams of SSPM measurement. (c) Electrostatic potential difference and interaction force between a neutral tip and a sample after electron diffusion. (d) External ac voltage with adjustable dc offset, which leads to a vibration being applied to the tip.

Image of FIG. 2.
FIG. 2.

Cross-sectional view of the medium.

Image of FIG. 3.
FIG. 3.

Topography (left) and CPD (right) images of (a) and (b) DVD-RW disks, which were written by a commercial recorder. The CPD images have been flattened.

Image of FIG. 4.
FIG. 4.

Simultaneously acquired images of (a) the topography and (b) the CPD on a disk written by a read∕write disk tester. The CPD image has been flattened.

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/content/avs/journal/jvsta/23/4/10.1116/1.1943449
2005-06-21
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Study of optical recording bits by scanning surface potential microscopy
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/23/4/10.1116/1.1943449
10.1116/1.1943449
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