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Changes in surface roughness and work function of indium-tin-oxide due to KrF excimer laser irradiation
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10.1116/1.1953670
/content/avs/journal/jvsta/23/5/10.1116/1.1953670
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/23/5/10.1116/1.1953670
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

AFM images of (a) as-cleaned ITO surface and (b) 25-min-irradiated ITO surface.

Image of FIG. 2.
FIG. 2.

(Color online). Observed SWF image of ITO films by KP. [(a) as-cleaned ITO; (b) 25-min-irradiated ITO; : the difference in work function between the tip and the observed object].

Image of FIG. 3.
FIG. 3.

XPS spectra of O 1 core level for (a) as-cleaned and (b) 25-min-irradiated ITO samples. (c) The difference energy spectrum (25-min-irradiated minus as cleaned).

Image of FIG. 4.
FIG. 4.

Change of relative atomic ratio on the ITO surfaces as a function of detection angle.

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/content/avs/journal/jvsta/23/5/10.1116/1.1953670
2005-07-22
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Changes in surface roughness and work function of indium-tin-oxide due to KrF excimer laser irradiation
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/23/5/10.1116/1.1953670
10.1116/1.1953670
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