1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Multilayer approach to the quantitative analysis of x-ray photoelectron spectroscopy results: Applications to ultrathin on Si and to self-assembled monolayers on gold
Rent:
Rent this article for
USD
10.1116/1.2008274
/content/avs/journal/jvsta/23/5/10.1116/1.2008274
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/23/5/10.1116/1.2008274
/content/avs/journal/jvsta/23/5/10.1116/1.2008274
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/avs/journal/jvsta/23/5/10.1116/1.2008274
2005-08-18
2014-07-29
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Multilayer approach to the quantitative analysis of x-ray photoelectron spectroscopy results: Applications to ultrathin SiO2 on Si and to self-assembled monolayers on gold
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/23/5/10.1116/1.2008274
10.1116/1.2008274
SEARCH_EXPAND_ITEM