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Topography in secondary ion mass spectroscopy images
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10.1116/1.2217980
/content/avs/journal/jvsta/24/5/10.1116/1.2217980
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/24/5/10.1116/1.2217980

Figures

Image of FIG. 1.
FIG. 1.

Illustration of how a microsphere becomes elongated in the SIMS imaging process.

Image of FIG. 2.
FIG. 2.

Simulated electric fields in TOF-SIMS for (a) insulating particle over a conducting substrate, (b) insulating particle over an insulating substrate, and (c) conducting particle over a conducting substrate.

Image of FIG. 3.
FIG. 3.

total ion images acquired using an ION-TOF IV reflection type instrument: (a) Pluronic coated glass fiber on a silicon substrate (normal orientation),(b) Pluronic coated glass fiber on a silicon substrate (parallel orientation), (c) Pluronic coated graphite fiber on a silicon substrate (normal orientation), (d) Pluronic coated graphite fiber on a silicon substrate (parallel orientation), (e) Pluronic coated glass fiber on a glass substrate (normal orientation), and (f) Pluronic coated glass fiber on a glass substrate (parallel orientation).

Image of FIG. 4.
FIG. 4.

total ion images acquired using a TRIFT instrument: (a) Pluronic coated glass fiber on a glass substrate (normal orientation), (b) Pluronic coated glass fibers on a silicon substrate (parallel orientation), (c) Pluronic coated graphite fiber on a silicon substrate (normal orientation), (d) Pluronic coated graphite fiber on a silicon substrate (parallel orientation), (e) Pluronic coated glass fiber on a glass substrate (normal orientation), and (f) Pluronic coated glass fiber on a glass substrate (parallel orientation).

Image of FIG. 5.
FIG. 5.

total ion images of microspheres: (a) Pluronic coated PS sphere on a glass substrate using a reflectron instrument, (b) Pluronic coated PS sphere on a silicon substrate using a TRIFT instrument, (c) gold coated sphere using a reflectron instrument, and (d) gold coated sphere using a TRIFT instrument.

Image of FIG. 6.
FIG. 6.

Scores plot of the first two principal component axes from two regions on a Pluronic coated PS sphere.

Image of FIG. 7.
FIG. 7.

(a) Contextual image of 5 class Poisson model for a glass fiber on a glass substrate; (b) contextural image of 2 class multinomial model for a glass fiber on a glass substrate.

Image of FIG. 8.
FIG. 8.

(a) Contextual image of 6 class Poisson model for a PS sphere on a silicon substrate; (b) contextural image of 2 class multinomial model for a PS sphere on a silicon substrate.

Image of FIG. 9.
FIG. 9.

Normalized spectra from a Pluronic coated PS sphere from two regions picked for analysis and the ratio of the spectra.

Image of FIG. 10.
FIG. 10.

Latent profiles from two regions of a Pluronic coated PS sphere using a 2 class multinomial model and their ratios.

Tables

Generic image for table
TABLE I.

Results of test using absolute intensities.

Generic image for table
TABLE II.

Results of test using relative intensities.

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/content/avs/journal/jvsta/24/5/10.1116/1.2217980
2006-08-02
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Topography in secondary ion mass spectroscopy images
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/24/5/10.1116/1.2217980
10.1116/1.2217980
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