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Tailored synthesis of ZnO:Er(III) nanosystems by a hybrid rf-sputtering/sol-gel route
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View: Figures


Image of FIG. 1.
FIG. 1.

GIXRD patterns for ZnO:Er(III) nanosystems synthesized as follows: (a) 3-dipping ZnO xerogels, rf-; and (b) 10-dipping ZnO xerogels, rf-. The annealing conditions for each specimen are reported in the figure.

Image of FIG. 2.
FIG. 2.

Dependence of surface atomic ratio determined by XPS on annealing temperature/time for ZnO:Er(III) nanosystems. Synthesis conditions: 3-dipping ZnO xerogels, rf-.

Image of FIG. 3.
FIG. 3.

XPS depth profiles of an annealed (, ) ZnO:Er(III) sample. Synthesis conditions: 10-dipping ZnO xerogels, rf-.

Image of FIG. 4.
FIG. 4.

SIMS depth profile of a ZnO:Er(III) specimen annealed at for . Synthesis conditions: 3-dipping ZnO xerogels; rf-.

Image of FIG. 5.
FIG. 5.

Optical absorption spectra of a ZnO:Er(III) nanosystem and a pure ZnO matrix annealed at for . The two spectra have been vertically shifted for clarity. Inset: Tauc plot of the ZnO:Er(III) specimen. The synthesis conditions are the same of Fig. 4 samples.

Image of FIG. 6.
FIG. 6.

Representative AFM surface micrographs of specimens annealed for at (a), (b), and (c), respectively. [(a) and (b)] 3-dipping ZnO xerogels, rf-; (c) 10-dipping ZnO xerogels, rf-.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Tailored synthesis of ZnO:Er(III) nanosystems by a hybrid rf-sputtering/sol-gel route