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Mechanisms of structural evolutions associated with the high current pulsed electron beam treatment of a NiTi shape memory alloy
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10.1116/1.2388951
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    Affiliations:
    1 School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024, People’s Republic of China and State Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Dalian University of Technology, Dalian 116024, People’s Republic of China
    2 School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024, People’s Republic of China; State Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Dalian University of Technology, Dalian 116024, People’s Republic of China; and Laboratoire d’Etude des Textures et Applications aux Matériaux (LETAM, UMR-CNRS 7078), Université Paul Verlaine de Metz, Ile du Saulcy, 57012 Metz, France
    3 Laboratoire d’Etude des Textures et Applications aux Matériaux (LETAM, UMR-CNRS 7078), Université Paul Verlaine de Metz, Ile du Saulcy, 57012 Metz, France
    4 Laboratoire de Physique des Matériaux (LPM, UMR-CNRS 7556), Ecole des Mines, Parc de Saurupt, 54042 Nancy, France
    5 School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024, People’s Republic of China and State Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Dalian University of Technology, Dalian 116024, People’s Republic of China
    a) Author to whom correspondence should be addressed; electronic mail: thierry.grosdidier@univ-metz.fr
    J. Vac. Sci. Technol. A 25, 28 (2007); http://dx.doi.org/10.1116/1.2388951
/content/avs/journal/jvsta/25/1/10.1116/1.2388951
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/25/1/10.1116/1.2388951
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Typical optical micrographs of the samples treated for five pulses [low magnification (a) and high magnification (b)] and ten pulses [low magnification (c) and high magnification (d)] showing craters, wavy surfaces, and some phase transformation witness marks present on the top surface.

Image of FIG. 2.
FIG. 2.

XRD analysis of the untreated and the treated samples, witnessing the presense of martensite and the dissolution of the precipitates after the HCPEB treatments.

Image of FIG. 3.
FIG. 3.

Typical SEM image of the surface obtained with a secondary electron detector (a) and its corresponding EBSD KPQ map (b) for the five pulsed HCPEB treated sample.

Image of FIG. 4.
FIG. 4.

EBSD OIM map of the surface of the five pulsed sample (a) and the corresponding pole figures (b). The analyzed zone is the same as for Fig. 3.

Image of FIG. 5.
FIG. 5.

Typical SEM image of the surface obtained with a secondary electron detector (a) and its corresponding EBSD KPQ map (b) for the ten pulsed HCPEB treated sample. Note in this case the presence of fine NiTi austenite (B2) grains protruding from the original large grains. Deformation marks are arrowed in (a).

Image of FIG. 6.
FIG. 6.

Typical SEM image of the surface obtained with a secondary electron detector (a) and its corresponding EBSD KPQ map (b) for the ten pulsed HCPEB treated sample. Note in this case the presence of fine NiTi austenite (B2) grains protruding from the original large grains. Deformation marks are arrowed in (a).

Image of FIG. 7.
FIG. 7.

SNMS composition profiles in Ni and Ti for the five pulsed HCPEB treated sample.

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2006-12-29
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Mechanisms of structural evolutions associated with the high current pulsed electron beam treatment of a NiTi shape memory alloy
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/25/1/10.1116/1.2388951
10.1116/1.2388951
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