Photon flux distribution as a function of photon energy: (a) derived white x rays at BL01A in NSRRC; (b) photon flux distribution at exposure position: for precursor solution (i) and immerged silicon substrate (ii).
Variations of the value of a Ni electroless solution as a function of the exposure time.
Thickness and P content of the Ni–P deposition films for different values.
SEM images of Ni–P films formed by irradiation with different values: (a) ; (b) (c); (d); .
XRD spectra of Ni–P films for different values: (a) 4; (b) 5; (c) 6; (d) 7; (e) 8.
Near-edge x-ray absorption fine structure spectra of Ni–P films with different P contents together with standard reference.
Adhesion strength of our Ni–P alloy films on silicon for different values.
Hypophosphite solution irradiated by x rays and the snapshot images after different irradiation periods taken at a speed of : (a) ; (b) ; (c) ; (d) ; (e) ; (f) ; (g) ; (h) ; (i) ; (j) .
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