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Surface and depth profile investigation of a phosphorylcholine-based contact lens using time of flight secondary ion mass spectrometry
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10.1116/1.2432350
/content/avs/journal/jvsta/25/4/10.1116/1.2432350
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/25/4/10.1116/1.2432350
/content/avs/journal/jvsta/25/4/10.1116/1.2432350
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/content/avs/journal/jvsta/25/4/10.1116/1.2432350
2007-07-02
2014-07-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Surface and depth profile investigation of a phosphorylcholine-based contact lens using time of flight secondary ion mass spectrometry
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/25/4/10.1116/1.2432350
10.1116/1.2432350
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