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Surface and depth profile investigation of a phosphorylcholine-based contact lens using time of flight secondary ion mass spectrometry
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10.1116/1.2432350
/content/avs/journal/jvsta/25/4/10.1116/1.2432350
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/25/4/10.1116/1.2432350

Figures

Image of FIG. 1.
FIG. 1.

Chemical structures of p(HEMA), 2-methacryloyloxy-ethylphosphorylcholine, and the ethylene dimethacrylate cross-linker used to formulate Omafilcon A contact lenses.

Image of FIG. 2.
FIG. 2.

Representative positive secondary ion mass spectrum from dehydrated Omafilcon A lenses. Characteristic fragments/ions from the polymer components are indicated by the formula in each spectral window. Symbols indicate the nearby chemical species in the figure that are deemed most important for each of the components in Fig. 1 (HEMA , phosphorylcholine related [◆], and ethylene dimethacrylate [‡]).

Image of FIG. 3.
FIG. 3.

Representative negative secondary ion mass spectrum from dehydrated Omafilcon A lenses. Characteristic fragments/ions from the polymer components are indicated by the formula in each spectral window. Symbols indicate the nearby chemical species in the figure that are deemed most important for components in Fig. 1 (HEMA and phosphoryl choline [◆]).

Image of FIG. 4.
FIG. 4.

Representative data showing secondary ion intensities of select species as a function of sputter ion beam fluence for dehydrated Omafilcon A lenses. Intensity profiles show the relative distribution of components at the surface vs the interior of lens.

Tables

Generic image for table
TABLE I.

Atomic concentrations as a function of take-off angle (TOA) from dehydrated Omafilcon A lenses. Standard deviations are obtained from five measurements at each TOA from multiple lenses.

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/content/avs/journal/jvsta/25/4/10.1116/1.2432350
2007-07-02
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Surface and depth profile investigation of a phosphorylcholine-based contact lens using time of flight secondary ion mass spectrometry
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/25/4/10.1116/1.2432350
10.1116/1.2432350
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