Schematic diagram of sample geometry for the incident polarized soft x-ray beam normal to UHMWPE sample surface with elongation direction parallel to . Also represented is angle made by the incident x-rays with the sample surface. At normal incidence , electric field vector is parallel to the sample surface, and at glancing incidence , is nearly perpendicular to the sample surface.
Partial-electron-yield NEXAFS spectrum of UHMWPE (GUR 1050) at the carbon -edge taken at normal incidence (solid curve) and at glancing incidence (dashed curve). The predominant peaks are resonance at and C–C at . Also shown is the subtraction , which highlights the C–H and C–C orientations.
C–H % molecular orientation for the C and X series with different elongation stress conditions is plotted. A linear regression fit is also shown as a solid line for the C series and as a dashed line for the X series.
C–C % orientation of GUR 1050 D series for parallel (black circles) and perpendicular (gray open squares) to the wear direction with respect to gamma radiation dosage. A linear regression fit is also represented by solid lines.
List of samples of UHMWPE (GUR 1050) studied using NEXAFS method. Various processing methods and wear/stress conditions with % C–C orientation from NEXAFS are also indicated.
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