SEM micrograph showing the tilted view of the as-deposited Cr straight nanorod sample (IIIA). The nanorods are grown on Si (100) substrate patterned with diameter polystyrene spheres. The fibrous growth of the nanorods can be clearly seen.
SEM micrographs showing the effect of swift heavy ion irradiation on the morphology of the diameter Cr slanted nanorods (sample I) by Ag ions. The fibrous growth of nanorods is clearly visible for (a) pristine sample IA, which smoothens after irradiation as seen in (b) for an identical sample ID irradiated at highest fluence of .
Variation of and with depth for ions in Cr matrix as determined by SRIM. Ratio of is . Thus, the defects can be considered to be due to electronic energy losses only. The two blue lines at 1 and indicate the length of the straight and slanted nanorods, respectively.
Representative force-penetration curve. The points and indicate the point of maximum load and indentation depth, respectively. The indentation depth has been determined by Doerner-Nix method.
AFM micrographs showing three of the five indent marks on the sample IIIA. The encircled portion in (a) shows the region before indentation and in (b) after indentation.
Variation of hardness with fluence is plotted for all the three sets. The Cr nanorods show an overall increasing trend in the hardness values. The solid lines are a guide for the eyes.
Typical GAXRD pattern obtained for pristine and irradiated straight Cr nanorods (sample III) is shown. The strongest Bragg peak is observed at value of 44°. The Cr (110) peak is also present in samples I and II (not shown).
Article metrics loading...
Full text loading...