Structural and magnetic properties of epitaxial
Vacuum plant of the ADAM sputtering chamber.
Relationship between deposition rate and magnetron power for . The rate is determined by dividing the film thickness determined by x-ray reflectivity by the deposition time.
X-ray diffraction data for (a) deposited at , (b) deposited at , (c) deposited at , followed by deposited at , and (d) a five-period superlattice of deposited at , followed by deposited at .
Neutron reflectivity of the critical edge of a growth temperature-modulated superlattice showing the increase in magnetic splitting as the sample is cooled. The dark triangles are and the open triangles are .
Spin splitting of the polarized neutron reflectivity curves as a function of measurement temperature. The splitting at is 20% of the value, consistent with a ferromagnetic Curie temperature of approximately .
Definition of parameters in the sputter rate calibration of FePt and Pt.
Parameters used to calculate (001) and (002) peak intensities for fully ordered .
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