Tape-test results showing the mean percent Au remaining for each sample type. Error bars are one standard deviation of the mean. (, , , , , , and ).
Representative optical micrographs of Au dot arrays on PMMA substrates. Left column is for samples immediately after Cr/Au deposition but before tape-pull test, center column is immediately after tape-pull test, and right column is for samples stored for 96 h at prior to Cr/Au deposition. Each Cr/Au dot diameter is : (a) control series, (b) remote plasma-treated, (c) hexane-cast, (d) toluene-cast, (e) chloroform-cast. Images have been converted to 8 bit grayscale. Edge roughness is due to laser-cut PMMA shadow mask.
ATR-FTIR data of PMMA substrate treated with spun-cast in the frequency range as a function of time after deposition as indicated in the figure. Also included is a cleaned PMMA control sample with no solvent exposure. Samples were stored in a dry box at atmospheric pressure and at between measurements.
(Color online) Integrated peak area ratio of ( bending mode): ( stretching mode) peaks from ATR-FTIR spectroscopy of PMMA substrate treated with spun-cast . Time dependence was measured up to 10 500 min (7 days) after deposition. Samples were stored in a dry box at atmospheric pressure and at between measurements.
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