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Effect of surface contamination on electron tunneling in the high bias range
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10.1116/1.4721640
/content/avs/journal/jvsta/30/4/10.1116/1.4721640
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/30/4/10.1116/1.4721640
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) Typical BEEM spectrum (dots) from the Au (in situ)/5 nm SiO2/n-Si with I t  = 8 nA. The fitting (solid line) was carried out with the constant-current Bell-Kaiser model with a fitting range of 0.5 V self-consistently above every barrier height being evaluated. The fitting gave a barrier height of 4.1 eV as indicated by the vertical line. (b) A typical BEEM spectrum from the Au (ex situ)/5 nm SiO2/n-Si with I t  = 5 nA. The barrier height appeared to be much higher than 4.1 eV. The fitting (solid line) gave a barrier height of ∼6.5 eV.

Image of FIG. 2.
FIG. 2.

(Color online) Representative BEEM spectrum (circles) taken at I t  = 5 nA from the in situ prepared sample without degassing. The fitting (solid line) was performed with constant-current Bell-Kaiser model and the fitting range was 0.5 eV self-consistently above every barrier height being evaluated. The fitting gave a barrier of 4.1 eV.

Image of FIG. 3.
FIG. 3.

(Color online) STM images (area of 200 nm × 200 nm) acquired at V Tip = −6.5 V, I t  = 1 nA (a) before (color scale: 5.5 nm) and (b) after (color scale: 5.5 nm) 20 BEEM spectra taken at the location as indicated by the red arrow.

Image of FIG. 4.
FIG. 4.

(Color online) BEEM spectra taken at the location indicated by the red arrow in Fig. 3(a). The spectra were acquired by ramping the tip bias from −9.9 V to −0.3 V and then ramping back at the same rate (setpoint: V Tip = −9.9 V, I t  = 4 nA). Only spectra in forward direction are shown for clarity. Only the first four spectra were labeled, as the changes for the rest were very minimal.

Image of FIG. 5.
FIG. 5.

(Color online) STM images (area of 200 nm × 200 nm) acquired at V Tip = −0.1 V, I t  = 0.5 nA (a) before (color scale: 12 nm) and (b) after (color scale: 12 nm) ten BEEM spectra taken at the location as indicated by the red arrow. The bump at the center of (a) was also created in the same way before this experiment.

Image of FIG. 6.
FIG. 6.

(Color online) BEEM spectra taken at the location indicated by the red arrow in Fig. 5(a). Spectra were acquired by ramping the tip bias from −0.1 V to −10 V and then ramping back at the same rate (setpoint: V Tip = −0.1 V, I t  = 5 nA). The sequence of the spectra was labeled, with each consisting of forward and backward directions.

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/content/avs/journal/jvsta/30/4/10.1116/1.4721640
2012-05-24
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of surface contamination on electron tunneling in the high bias range
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/30/4/10.1116/1.4721640
10.1116/1.4721640
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